| Title | Measurement-induced criticality in random quantum circuits |
| Publication Type | Journal Article |
| Year of Publication | 2020 |
| Authors | Chao-Ming Jian, Yi-Zhuang You, Romain Vasseur, Andreas W. W. Ludwig |
| Journal | Physical Review B [Editors' Suggestion] |
| Volume | 101 |
| Date Published | Mar |
| ISSN | 2469-9969 |
| URL | http://dx.doi.org/10.1103/PhysRevB.101.104302 |
| DOI | 10.1103/physrevb.101.104302 |
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